منابع مشابه
Quantum degeneracy in atomic point contacts revealed by chemical force and conductance.
Quantum degeneracy is an important concept in quantum mechanics with large implications to many processes in condensed matter. Here, we show the consequences of electron energy level degeneracy on the conductance and the chemical force between two bodies at the atomic scale. We propose a novel way in which a scanning probe microscope can detect the presence of degenerate states in atomic-sized ...
متن کاملSupercurrent in atomic point contacts and andreev states
We have measured the supercurrent in aluminum atomic point contacts containing a small number of well characterized conduction channels. For most contacts, the measured supercurrent is adequately described by the opposite contributions of two thermally populated Andreev bound states per conduction channel. However, for contacts containing an almost perfectly transmitted channel 0.9</=tau</=1 th...
متن کاملMulti-Point Boundary Tracking For Atomic Force Microscopy
This paper presents several approaches for efficient imaging on the atomic force microscope (AFM) using boundary tracking. In addition to the refinement and generalization of existing algorithms such as those of Andersson [1][2] and Chen [3] , a new multi-point model is proposed. In this model, variables are calculated according to a set of consecutive measurements rather than updated on a poin...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملCalibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantile...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2005
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.2084347